Seah, M P (1999) Quantitative AES and XPS: convergance between theory and experimental databases. J. Electron Spectrosc. Relat. Phenom., 100. pp. 55-73.

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Item Type:	Article
Subjects:	Advanced Materials
Last Modified:	02 Feb 2018 13:18
URI:	https://eprintspublications.npl.co.uk/id/eprint/1503