Cook, R J; Alexander, M J; Gentle, D G; Holland, K P; McNair, P A C (1995) Traceability to national and international standards for EMC conformance testing. In: NCSL National Conference of Standards Laboratories - Workshop and Symposium, July 1995, Dallas, USA.
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Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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Subjects: | Electromagnetics Electromagnetics > RF and Microwave |
Last Modified: | 02 Feb 2018 13:19 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/1338 |
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