Hunt, C; Zou, L (1999) Development of a new surface insulation resistance (SIR) test method. NPL Report. CMMT(A)235

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Abstract

In a previous part of this work the functional dependence of the SIR parameters has been studied. A draft SIR test method has been produced here. The method is significantly different to the existing standard in a number respects and reflects the advances in electronics manufacturing and the improvements in the instrumentation. The work has involved evaluating the effects of a number of parameters (e.g. test time, test bias, test temperature and humidity, board pattern and board finish) and recommending suitable test conditions for the SIR measurements. The method represents a major step forward in improving the sensitivity of the test and its ability to predict reliability. This method has been tested and validated as part of an intercomparison, the results of which confirmed that the viability of the method.

Item Type:	Report/Guide (NPL Report)
NPL Report No.:	CMMT(A)235
Subjects:	Advanced Materials Advanced Materials > Electronics Interconnection
Last Modified:	02 Feb 2018 13:17
URI:	http://eprintspublications.npl.co.uk/id/eprint/1272

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