Alexander, M J (1999) Testing comes in from the cold. IEE Review (Novemb). pp. 265-267.

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Item Type:	Article
Subjects:	Electromagnetics Electromagnetics > RF and Microwave
Last Modified:	02 Feb 2018 13:18
URI:	http://eprintspublications.npl.co.uk/id/eprint/1231

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