Lowrie, F*; Cain, M G; Stewart, M; Gee, M G (1999) Time dependent behaviour of piezo-electric materials. NPL Report. CMMT(A)151

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Abstract

The aim of this study was to investigate whether finite element (FE) modelling could be used to predict the degradation over time of a piezoelectric device. The device used was a bimorph transducer. Degradation data were supplied by NPL derived by the mechanical fatiguing of disc specimens and the intermittent measurement of the piezoelectric parameters using an electrically excited resonance technique. These data were inserted into the FE model and a strain response was predicted at all points in the material. This prediction was then compared to the measured strain of a device which had been electrically fatigued.
Unfortunately, due to the mechanical failure of the electrode assemblies in the bimorph devices, the model could not be validated comprehensively. However, from the limited data sets which were obtained the FE model gave a shortened prediction of lifetime.

Item Type:	Report/Guide (NPL Report)
NPL Report No.:	CMMT(A)151
Subjects:	Advanced Materials Advanced Materials > Functional Materials
Last Modified:	10 Sep 2018 13:14
URI:	http://eprintspublications.npl.co.uk/id/eprint/1059

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