Renaud, J; Giblin, S P (2024) Metrological characterisation of a commercial source-measure unit for small DC currents. In: 2024 Conference on Precision Electromagnetic Measurements (CPEM), 08-12 July 2024, Denver, CO, USA.

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Abstract

We have performed a detailed characterisation of a commercial small current source-measure unit (SMU), the Keithley 6430, by calibrating it against an accurate reference current source on current ranges from 1 nA to 1 mA. The instrument shows a marked non-linearity at small fractions of full-scale, but over a period of four years its gain factor is stable to better than 50 μA/A on all ranges. This is sufficient for practical applications in metrology fields such as ionising radiation or photometry.

Item Type:	Conference or Workshop Item (Paper)
Keywords:	current source, calibration
Subjects:	Electromagnetics > Electrical Measurement
Divisions:	Quantum Technologies
Publisher:	IEEE
Identification number/DOI:	10.1109/CPEM61406.2024.10646060
Last Modified:	03 Jul 2026 14:17
URI:	https://eprintspublications.npl.co.uk/id/eprint/10478