Skinner, J; Gruber, M; Eichstädt, S; Appleby, R; Ridler, N M (2025) Metrology for Time-Domain Transformed and Time-Gated S-Parameters Using Pydynamic. In: 2025 105th ARFTG Microwave Measurement Conference (ARFTG), 20 June 2025, San Fransisco, CA, USA.

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Abstract

A software package for VNA time-domain metrology is demonstrated. Named PyDynamic, this software provides uncertainty propagation for S-parameters measured in the frequency domain transformed to the time-domain, time-gated and transformed back to the frequency domain. Here, using VNA measurements of a mismatched coaxial line as inputs, the results produced by PyDynamic at each step of the time-gating process are presented and compared with industry references. Through these comparisons, the metrological validity of the results from PyDynamic is established, and its suitability for providing metrologically credible time-gated S-parameters with uncertainties is demonstrated.

Item Type:	Conference or Workshop Item (Paper)
Keywords:	time-domain vector, network analyzer, s-parameters, time-gating
Subjects:	Electromagnetics > RF and Microwave
Divisions:	Electromagnetic & Electrochemical Technologies
Publisher:	IEEE
Identification number/DOI:	10.1109/ARFTG65332.2025.11168150
Last Modified:	18 Mar 2026 15:31
URI:	https://eprintspublications.npl.co.uk/id/eprint/10329