Skinner, J; Celep, M; Protheroe, S; Fletcher, N; Ridler, N M (2025) Metrological Traceability for the Impedance of Coaxial Devices Using an LCR Meter. IEEE Transactions on Instrumentation and Measurement, 74. 1009009 ISSN 0018-9456
Full text not available from this repository.Abstract
In this paper, capability for traceable impedance measurements of Type-N coaxial devices implemented using an LCR meter is presented. An LCR meter, operating at frequencies between 1 kHz and 1 MHz, was fitted with a 4-terminal pair to coaxial adapter to interface with Type-N devices. An error model for calibrating the LCR meter and steps to characterize the Short- and Open-circuit calibration standards are detailed. To verify the measurement system, measurements were compared with VNA techniques. Finally, the measured impedance of a well-matched 50 Ω Type-N power sensor was converted to linear reflection coefficient, and an uncertainty for linear magnitude in the region of 0.2 mU (milli-units)(k = 2) is reported. This capability has the potential to provide measurements of reflection coefficient of devices in coaxial line with very low uncertainties.
| Item Type: | Article |
|---|---|
| Keywords: | Coaxial connector, impedance, LCR meter, reflection coefficient, traceability, vector network analyzer (VNA) |
| Subjects: | Electromagnetics > Electrical Measurement |
| Divisions: | Electromagnetic & Electrochemical Technologies |
| Identification number/DOI: | 10.1109/TIM.2025.3563005 |
| Last Modified: | 12 Mar 2026 13:57 |
| URI: | https://eprintspublications.npl.co.uk/id/eprint/10310 |
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