Shang, X; Shu, M; Naftaly, M; Ridler, N M; Hanham, S M (2024) Characterization of Dielectric Materials at WM-380 Band (500 - 750 GHz) Using Three Broadband Measurement Techniques. In: 2024 103rd ARFTG Microwave Measurement Conference (ARFTG), 21 June 2024, Washington DC, USA.

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Abstract

This paper presents an interlaboratory comparison of three widely employed broadband dielectric measurement techniques in the terahertz region - namely, material characterization kit (MCK), conventional free-space method, and time domain spectroscopy (TDS). The comparison was undertaken within the WM-380 band (500-750 GHz), utilizing five common dielectric materials (ABS, HDPE, fused silica, YAG, and high-resistivity silicon). The results are discussed in detail, and generally good agreement in the extracted permittivity and loss tangent between these techniques is demonstrated.

Item Type:	Conference or Workshop Item (Paper)
Subjects:	Electromagnetics > RF and Microwave
Divisions:	Electromagnetic & Electrochemical Technologies
Identification number/DOI:	10.1109/ARFTG61196.2024.10660787
Last Modified:	25 Sep 2024 13:41
URI:	https://eprintspublications.npl.co.uk/id/eprint/10059