Article

Trindade, G F; Keenan, M R; Pirkl, A; Fartmann, M; Hou, Y; Kern, C; Kotowska, A; Lamann, K; Matsuo, M; Paladino, E; Qiu, J; Tallarek, E; Zhou, Y; Rohnke, M; Weng, L-T; Gilmore, I S (2026) Interlaboratory Comparison of Orbitrap Analyzers in OrbiSIMS: Noise Parameters, Intensity Scaling, and Detection Limits. Journal of the American Society for Mass Spectrometry, 37 (8). pp. 1883-1889. ISSN 1044-0305

Zhou, Y; Franquet, A; Spampinato, V; Merkulov, A; Keenan, M R; van der Heide, P A W; Trindade, G F; Vandervorst, W; Gilmore, I S (2024) OrbiSIMS depth profiling of semiconductor materials - useful yield and depth resolution. Journal of Vacuum Science & Technology A, 42 (5). 053208