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Traceable metrology for scanning probe microscopes.

Haycocks, J; Jackson, K; Robbie, C J; Stedman, M (1997) Traceable metrology for scanning probe microscopes. In: Proc. 2nd Seminar on Quantitive Microscopy, November 1997, PTB, Germany.

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Abstract

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: Engineering Measurements
Engineering Measurements > Dimensional
Last Modified: 02 Feb 2018 13:18
URI: http://eprintspublications.npl.co.uk/id/eprint/774

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