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Evaluation of preparation methods for suspended nano objects on substrates for dimensional measurements by atomic force microscopy

Fiala, P; Gohler, D; Wessely, B; Stintz, M; Lazzerini, G M; Yacoot, A (2017) Evaluation of preparation methods for suspended nano objects on substrates for dimensional measurements by atomic force microscopy. Beilstein Journal of Nanotechnology, 8. pp. 1774-1785.

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Abstract

Dimensional measurements on nano-objects by atomic force microscopy (AFM) require samples of safely fixed and well individualized particles with a suitable surface-specific particle number on flat and clean substrates. Several known and proven particle preparation methods, i.e. membrane filtration, drying, rinsing, dip coating as well as electrostatic and thermal precipitation, were performed to examine their suitability for preparing samples for dimensional measurements.
Different suspensions of nano-objects (with varying material, size and shape) stabilized in aqueous solutions were prepared on hard Si and SiO2 coated Si substrates. The drop drying method was found to be the most suitable one for the used suspensions of nano-objects, because it does not require expensive dedicated equipment and led to a uniform local distribution of individualized nano-objects. Traceable AFM measurements confirmed the suitability of this technique.

Item Type: Article
Subjects: Engineering Measurements > Dimensional
Divisions: Engineering, Materials & Electrical Science
Identification number/DOI: 10.3762/bjnano.8.179
Last Modified: 06 Feb 2018 10:38
URI: http://eprintspublications.npl.co.uk/id/eprint/7676

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