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Embedding-free method for preparation of cross-sections of organic materials for micro chemical analysis using gas cluster ion beam sputtering.

Mihara, I; Havelund, R; Gilmore, I S (2017) Embedding-free method for preparation of cross-sections of organic materials for micro chemical analysis using gas cluster ion beam sputtering. Anal. Chem., 89 (9). pp. 4781-4785.

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Abstract

No abstract available

Item Type: Article
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Divisions: Chemical, Medical & Environmental Science
Identification number/DOI: 10.1021/acs.analchem.7b00511
Last Modified: 09 Feb 2018 13:43
URI: http://eprintspublications.npl.co.uk/id/eprint/7556

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