< back to main site

Publications

Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode.

Rerucha, S*; Yacoot, A; Pham, T M*; Cizek, M*; Hucl, V*; Lazar, J*; Cip, O* (2017) Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode. Meas. Sci. Technol., 28 (4). 045204

Full text not available from this repository.

Abstract

We demonstrated that an iodine stabilized Distributed Bragg Reflector (DBR) diode based laser system lasing at a wavelength in close proximity to 633 nm could be used as an alternative laser source to the He-Ne lasers in both scientific and industrial metrology. This yields additional advantages besides the optical frequency stability and coherence: inherent traceability, wider optical frequency tuning range, higher output power and high frequency modulation capability. We experimentally investigated the characteristics of the laser source in two major steps: first using a wavelength meter referenced to a frequency comb controlled with a hydrogen maser and then on a interferometric optical bench testbed where we compared the performance of the laser system with that of a traditional frequency stabilized He-Ne laser. The results indicate that DBR diode laser system provides a good laser source for applications in dimensional (nano)metrology, especially in conjunction with novel interferometric detection methods exploiting high frequency modulation or multiaxis measurement systems.

Item Type: Article
Subjects: Engineering Measurements
Engineering Measurements > Dimensional
Divisions: Engineering, Materials & Electrical Science
Identification number/DOI: 10.1088/1361-6501/aa5ab9
Last Modified: 02 Feb 2018 13:13
URI: http://eprintspublications.npl.co.uk/id/eprint/7455

Actions (login required)

View Item View Item