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Quadrature wavelength scanning interferometry.

Moschetti, G; Forbes, A B; Leach, R K*; Jiang, X*; O'Connor, D (2016) Quadrature wavelength scanning interferometry. Appl. Opt., 55 (20). pp. 5332-5340.

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Abstract

No abstract available

Item Type: Article
Keywords: surface measurement, interferometry
Subjects: Engineering Measurements
Engineering Measurements > Dimensional
Identification number/DOI: 10.1364/AO.55.005332
Last Modified: 02 Feb 2018 13:13
URI: http://eprintspublications.npl.co.uk/id/eprint/7167

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