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Sampling depths, depth shifts and depth resolutions for Bi-n(+) ion analysis in argon gas cluster depth profiles.

Havelund, R; Seah, M P; Gilmore, I S (2016) Sampling depths, depth shifts and depth resolutions for Bi-n(+) ion analysis in argon gas cluster depth profiles. J. Phys. Chem. B, 120 (9). pp. 2604-2611.

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Abstract

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Item Type: Article
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Identification number/DOI: 10.1021/acs.jpcb.5b12697
Last Modified: 02 Feb 2018 13:13
URI: http://eprintspublications.npl.co.uk/id/eprint/7068

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