< back to main site

Publications

Multivariate analysis of 3D ToF-SIMS images: method validation and application to cultured neuronal networks.

Van Nuffel, S*; Parmenter, C*; Scurr, D J*; Russell, N A*; Zelzer, M (2016) Multivariate analysis of 3D ToF-SIMS images: method validation and application to cultured neuronal networks. Analyst, 141 (1). pp. 90-95.

Full text not available from this repository.

Abstract

No abstract available

Item Type: Article
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Identification number/DOI: 10.1039/c5an01743b
Last Modified: 02 Feb 2018 13:13
URI: http://eprintspublications.npl.co.uk/id/eprint/6953

Actions (login required)

View Item View Item