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Coherent interaction with two-level fluctuators using near field scanning microwave microscopy.

de Graaf, S E; Danilov, A V*; Kubatkin, S E* (2015) Coherent interaction with two-level fluctuators using near field scanning microwave microscopy. Sci. Rep., 5. p. 17176.

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Abstract

Near field scanning microwave microscopy (NSMM) is a scanning probe technique that non-invasively can obtain materials properties on the nanoscale at microwave frequencies. While focus has been on developing room-tempearure systems it was recently shown that this technique can potentially reach the quantum regime with applications in materials science and device characterization in solid state quantum information processing. In this paper we theoretically investigate this new regime of NSMM. Specifically we show that interaction between the NSMM probe and certain types of two-level systems become possible when the NSMM probe operates in the (sub-) single photon regime, and we expect a high signal-to-noise ratio if operated under the right conditions. This would allow to detect single atomic material defects with energy splittings in the GHz range with nanoscale resolution, provided that the dielectric material under investigation has a suficciently low density of defects. Our estimated maximum detectable defect density is well above that of materials used in todays quantum circuits and devices. We also propose several extensions to a resonant NSMM that could improve sensitivity and functionality also for microscopes operating in a "classical" regime.

Item Type: Article
Subjects: Quantum Phenomena
Quantum Phenomena > Nanophysics
Identification number/DOI: 10.1038/srep17176
Last Modified: 02 Feb 2018 13:13
URI: http://eprintspublications.npl.co.uk/id/eprint/6876

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