< back to main site

Publications

Development of low-cost material measures for calibration of the metrological characteristics of areal surface texture instruments.

Leach, R K; Giusca, C; Guttmann, M*; Jakobs, P J*; Rubert, P* (2015) Development of low-cost material measures for calibration of the metrological characteristics of areal surface texture instruments. CIRP Ann. - Manuf. Technol., 64 (1). pp. 545-548.

Full text not available from this repository.

Abstract

In this paper, the development of a number of material measures, which are designed to allow users to calibrate areal surface texture instruments, is presented. The material measures include grid structures, which allow the determination of the amplification, linearity and squareness of the x, y and z-axes, and star patterns, which allow the determination of the lateral period limit. Relatively complex methods of manufacture have been used to produce master artefacts, which are then replicated to produce cost-effective artefacts for users. The process chain for the material measures is presented along with the methods used to calibrate them.

Item Type: Article
Subjects: Engineering Measurements
Engineering Measurements > Dimensional
Identification number/DOI: 10.1016/j.cirp.2015.03.002
Last Modified: 02 Feb 2018 13:13
URI: http://eprintspublications.npl.co.uk/id/eprint/6747

Actions (login required)

View Item View Item