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The matrix effect in organic secondary ion mass spectrometry.

Shard, A G; Spencer, S J; Smith, S A; Havelund, R*; Gilmore, I S (2015) The matrix effect in organic secondary ion mass spectrometry. Int. J. Mass Spectrom., 377. pp. 599-609.

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Abstract

Well defined reference materials consisting of Irganox 1010 and either Irganox 1098 or Fmoc-pentafluoro-L-phenylalanine (Fmoc-PFLPA) are described. These have been analysed with time-of-flight secondary ion mass spectrometry (ToF-SIMS) using argon gas cluster ions, 5keV Ar2000+ ions, as a sputtering source and 25 keV Bi3+ ions as a primary source for analysis. We demonstrate that the binary mixtures of Irganox 1010 and Irganox 1098 demonstrate some weak matrix effects whereas the mixtures of Irganox 1010 and Fmoc-PFLPA demonstrate some strong and unusual matrix effects. A parameter, , is introduced to describe the magnitude of the matrix effect in organic SIMS and a method to correct for the different apparent depths of origin of secondary ions in a depth profile. With some knowledge of the matrix effect magnitude and sign provided by it becomes possible to select secondary ions for reliable quantitative analysis in binary mixtures. We also indicate how the differences in ¿ between different secondary ions may, in the future, be exploited to assess compositional variation or nanoscale phase separation in materials.

Item Type: Article
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Identification number/DOI: 10.1016/j.ijms.2014.06.027
Last Modified: 02 Feb 2018 13:13
URI: http://eprintspublications.npl.co.uk/id/eprint/6663

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