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3D ToF-SIMS imaging pf polymer multi layer films using argon cluster sputter depth profiling.

Bailey, J*; Havelund, R; Shard, A G; Gilmore, I S; Alexander, M R*; Sharp, J S*; Scurr, D J* (2015) 3D ToF-SIMS imaging pf polymer multi layer films using argon cluster sputter depth profiling. ACS Appl. Mater. Interfaces, 7 (4). pp. 2654-2659.

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Abstract

No abstract available

Item Type: Article
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Identification number/DOI: 10.1021/am507663v
Last Modified: 02 Feb 2018 13:13
URI: http://eprintspublications.npl.co.uk/id/eprint/6589

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