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Angle-dependence of argon gas cluster sputtering yields for organic materials.

Seah, M P; Spencer, S J; Shard, A G (2015) Angle-dependence of argon gas cluster sputtering yields for organic materials. J. Phys. Chem. B, 119 (7). pp. 3297-3303.

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Abstract

The first angle-dependent measurements of the sputtering yield an organic material using argon gas cluster ions under a wide range of conditions are reported in order to develop an analytical description of the behavior important for the development of the application of secondary ion mass spectrometry to organic and biological systems. Data are presented for Irganox 1010 using argon gas cluster ion beams of 5 and 10 keV energy, E, with cluster sizes, n, from 1000 to 5000. The measurements are conducted in an X-ray photoelectron spectrometer for a range of angles from 0° to 80° from the surface normal. The results support the Universal Equation for argon gas cluster sputtering yields with the angle-dependence incorporated into the equation via a simple angle-dependence of the parameter A. This explains how and why the angular dependence of the sputtering yield changes significantly with increasing E/n. These results are also accurately confirmed using the published measurements for polystyrene by Rading et al.

Item Type: Article
Keywords: GCIB, Irganox 1010, organic electronics, organics, SIMS
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Identification number/DOI: 10.1021/jp512379k
Last Modified: 02 Feb 2018 13:13
URI: http://eprintspublications.npl.co.uk/id/eprint/6580

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