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Traceable thickness determination of organic nanolayers by X-ray reflectometry.

Wernecke, J*; Shard, A G; Krumrey, M* (2014) Traceable thickness determination of organic nanolayers by X-ray reflectometry. Surf. Interface Anal., 46 (10-11). pp. 911-914.

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Abstract

No abstract available

Item Type: Article
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Identification number/DOI: 10.1002/sia.5371
Last Modified: 02 Feb 2018 13:14
URI: http://eprintspublications.npl.co.uk/id/eprint/6471

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