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Duel beam organic profiling using large argon cluster ion beams.

Holzweber, M*; Shard, A G; Jungnickel, H*; Luch, A*; Unger, W E S* (2014) Duel beam organic profiling using large argon cluster ion beams. Surf. Interface Anal., 46 (10-11). pp. 936-939.

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Abstract

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Item Type: Article
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Identification number/DOI: 10.1002/sia.5429
Last Modified: 02 Feb 2018 13:13
URI: http://eprintspublications.npl.co.uk/id/eprint/6470

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