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Fundamental aspects of Ar-n(+) SIMS profiling of common organic semiconductors.

Fleischmann, C*; Conard, T*; Havelund, R; Franquet, A*; Poleunis, C*; Voroshazi, E*; Delcorte, A*; Vandervorst, W* (2014) Fundamental aspects of Ar-n(+) SIMS profiling of common organic semiconductors. Surf. Interface Anal., 46. pp. 54-57.

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Abstract

No abstract available

Item Type: Article
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Identification number/DOI: 10.1002/sia.5621
Last Modified: 02 Feb 2018 13:13
URI: http://eprintspublications.npl.co.uk/id/eprint/6468

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