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Accurate measurement of enhancement factor in tip-enhanced Raman spectroscopy through elimination of far-field artefacts.

Kumar, N*; Rae, A; Roy, D (2014) Accurate measurement of enhancement factor in tip-enhanced Raman spectroscopy through elimination of far-field artefacts. Appl. Phys. Lett., 104 (12). 123106

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Abstract

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Item Type: Article
Subjects: Analytical Science
Analytical Science > Trace Analysis and Electrochemistry
Identification number/DOI: 10.1063/1.4869184
Last Modified: 24 Jul 2018 12:59
URI: http://eprintspublications.npl.co.uk/id/eprint/6171

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