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Standardization of surface potential measurements of graphene domains.

Panchal, V; Pearce, R; Yakimova, R*; Tzalenchuk, A; Kazakova, O (2013) Standardization of surface potential measurements of graphene domains. Sci. Rep., 3. p. 2597.

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Abstract

We compare the three most commonly used scanning probe techniques to obtain a reliable value of the work function in graphene domains of different thickness. The surface potential (SP) of graphene is directly measured in Hall bar geometry via a combination of electrical functional microscopy and spectroscopy techniques, which enables calibrated work function measurements of graphene domains in ambient conditions with values F1LG ~4.55±0.02 eV and F2LG ~4.44±0.02eV for single- and bi-layer, respectively. We demonstrate that frequency-modulated Kelvin probe force microscopy (FM-KPFM) provides more accurate measurement of the SP than amplitude-modulated (AM)-KPFM. The discrepancy between experimental results obtained by different techniques is discussed. In addition, we use FM-KPFM for contactless measurements of the specific components of the device resistance. We show a strong non-Ohmic behavior of the electrode-graphene contact resistance and extract the graphene channel resistivity.

Item Type: Article
Subjects: Nanoscience
Nanoscience > Nano-Materials
Identification number/DOI: 10.1038/srep02597
Last Modified: 02 Feb 2018 13:14
URI: http://eprintspublications.npl.co.uk/id/eprint/5936

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