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Identification and separation of protein, contaminant and substrate peaks using gentle-secondary ion mass spectrometry and the g-ogram.

Aoyagi, S*; Gilmore, I S; Mihara, I*; Seah, M P; Fletcher, I W* (2012) Identification and separation of protein, contaminant and substrate peaks using gentle-secondary ion mass spectrometry and the g-ogram. Rapid Commun. Mass Spectrom., 26 (23). pp. 2815-2821.

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Abstract

No abstract available

Item Type: Article
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Identification number/DOI: 10.1002/rcm.6409
Last Modified: 02 Feb 2018 13:14
URI: http://eprintspublications.npl.co.uk/id/eprint/5653

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