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Intelligent sampling for the measurement of structured surfaces.

Wang, J*; Jiang, X*; Blunt, L A*; Leach, R K; Scott, P J* (2012) Intelligent sampling for the measurement of structured surfaces. Meas. Sci. Technol., 23 (8). 085006

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Abstract

No abstract available

Item Type: Article
Subjects: Engineering Measurements
Engineering Measurements > Dimensional
Identification number/DOI: 10.1088/0957-0233/23/8/085006
Last Modified: 02 Feb 2018 13:14
URI: http://eprintspublications.npl.co.uk/id/eprint/5539

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