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Summary of ISO/TC 201 Standard: ISO 18115-1:2010 - surface chemical analysis - vocabulary - general terms and terms used in spectroscopy.

Seah, M P (2012) Summary of ISO/TC 201 Standard: ISO 18115-1:2010 - surface chemical analysis - vocabulary - general terms and terms used in spectroscopy. Surf. Interface Anal., 44 (5). pp. 618-620.

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Abstract

This International Standard revises ISO 18115:2001 and the two subsequent amendments by bringing the material up to date and separating out the general terms and terms used in spectroscopy into Part 1, and terms relating to scanning probe microscopy into Part 2. This part, Part 1, covers 548 terms used in Auger electron spectroscopy, elastic peak electron spectroscopy, reflected electron energy loss spectroscopy, secondary ion mass spectrometry, ultra-violet photoelectron spectroscopy, X-ray photoelectron spectroscopy, etc as well as 52 acronyms. The terms cover words or phrases used in describing the samples, instruments and theoretical concepts involved in surface chemical analysis.

Item Type: Article
Keywords: AES, instrumentation, samples, SIMS, surface analysis, terminology, vocabulary, XPS
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Identification number/DOI: 10.1002/sia.4877
Last Modified: 02 Feb 2018 13:14
URI: http://eprintspublications.npl.co.uk/id/eprint/5419

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