< back to main site

Publications

Quantitative nanoscale surface voltage measurement on organic semiconductor blends.

Cuenat, A; Muñiz-Piniella, A; Muñoz-Rojo, M; Tsoi, W C*; Murphy, C E (2012) Quantitative nanoscale surface voltage measurement on organic semiconductor blends. Nanotechnology, 23 (4). 045703

Full text not available from this repository.

Abstract

We report on the validation of a method based on Kelvin probe force microscopy (KPFM) able to measure the different phases and the relative work function of polymer blend heterojunctions at the nanoscale. The method does not necessitate complex ultra-high vacuum setup. The quantitative information that can be extracted from the topography and the Kelvin probe measurements is critically analysed. Surface voltage difference can be observed at the nanoscale on poly(3-hexyl-thiophene):[6,6]-phenyl-C61-butyric acid methyl ester (P3HT:PCBM) blends and dependence on the annealing condition and the regio-regularity of P3HT is observed.

Item Type: Article
Subjects: Nanoscience
Nanoscience > Nano-Materials
Identification number/DOI: 10.1088/0957-4484/23/4/045703
Last Modified: 02 Feb 2018 13:14
URI: http://eprintspublications.npl.co.uk/id/eprint/5335

Actions (login required)

View Item View Item