< back to main site

Publications

Quantitative molecular depth profiling of organic delta-layers by C-60 ion sputtering and SIMS.

Shard, A G; Green, F M; Brewer, P J; Seah, M P; Gilmore, I S (2008) Quantitative molecular depth profiling of organic delta-layers by C-60 ion sputtering and SIMS. J. Phys. Chem. B, 112 (9). pp. 2596-2605.

Full text not available from this repository.

Abstract

No abstract available

Item Type: Article
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Last Modified: 02 Feb 2018 13:15
URI: http://eprintspublications.npl.co.uk/id/eprint/5053

Actions (login required)

View Item View Item