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Relationships between cluster secondary ion mass intensities generated by different cluster primary ions.

Seah, M P; Green, F M; Gilmore, I S (2010) Relationships between cluster secondary ion mass intensities generated by different cluster primary ions. J. Am. Soc. Mass Spectrom., 21 (3). pp. 370-377.

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Abstract

No abstract available

Item Type: Article
Keywords: cluster ions, secondary ion intensities, silicon, SIMS, sputtering
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Last Modified: 02 Feb 2018 13:15
URI: http://eprintspublications.npl.co.uk/id/eprint/4588

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