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Towards quantum based metrology for photonic technologies.

Beaumont A R,, ; Cheung, J Y; Chunnilall, C J; Dunn, M H*; Porrovecchio, G*; Smid, M*; Theocharous, E*; Thomas, P J* (2009) Towards quantum based metrology for photonic technologies. In: 9th Optical Fibre Measurement Conference (OFMC) Digest, 16-18 September 2009, NPL, Teddington,UK.

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Abstract

Quantum optical information technologies such as key distribution systems for secure communications, which are based on the discrete and quantum properties of photons, are now commercial products. Market take-up of these and other developing quantum technologies will be compromised unless there are traceable measurements to validate the performance of these devices. We highlight some ongoing collaborative research that will provide the required high accuracy techniques for the few and single photon regime, including operation at telecom wavelengths.

Item Type: Conference or Workshop Item (UNSPECIFIED)
Keywords: photon, telecoms
Subjects: Quantum Phenomena
Quantum Phenomena > Quantum Information Processing and Communication
Last Modified: 02 Feb 2018 13:15
URI: http://eprintspublications.npl.co.uk/id/eprint/4580

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