< back to main site

Publications

Sample cooling or rotation improves C60 organic depth profiles on multi-layered reference samples: results from a VAMAS interlaboratory study.

Sjövall, P*; Rading, D*; Ray, S; Yang, L; Shard, A G (2010) Sample cooling or rotation improves C60 organic depth profiles on multi-layered reference samples: results from a VAMAS interlaboratory study. J. Phys. Chem. B, 114 (2). pp. 769-774.

Full text not available from this repository.

Abstract

We demonstrate two methods to improve the quality of organic depth profiling using multilayered reference samples. Sample cooling has been shown previously to be useful in extending the useful depth over which organic materials can be profiled. We reinforce these findings and demonstrate that cooling results in a lower initial sputtering yield to approximately -40 ºC, but the improvement in useful profiling depth continues as the sample is cooled further even though there is no further reduction in the initial sputtering yield. We report, for the first time, the use of rotation in organic depth profiling and demonstrate that the initial sputtering yield at room temperature is maintained throughout the depth of the samples used in this study. Useful profiling depth and good depth resolution are both associated with a constant sputtering yield. The fact that rotation results in the maintenance of depth resolution underlines the fact that depth resolution is often limited by the development ion-beam induced topography. Constant sputtering yield results in a constant secondary ion yield, after transient processes have occurred and this allows simple quantification methods to be applied to organic depth profiling data.

Item Type: Article
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Last Modified: 02 Feb 2018 13:15
URI: http://eprintspublications.npl.co.uk/id/eprint/4565

Actions (login required)

View Item View Item