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A traceability infrastructure for three-dimensional surface measurements at the National Physical Laboratory.

Leach, R K; Giusca, C*; Naoi, K* (2009) A traceability infrastructure for three-dimensional surface measurements at the National Physical Laboratory. In: Proceedings of the 9th euspen International Conference, 2-5 June 2009, San Sebastian, Spain.

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Abstract

The manufacture of three-dimensional structured surfaces is leading to a step change in the design and production of modern manufactured products. In the near future, new ISO standards for the measurement and characterisation of three-dimensional (areal) surfaces will be published and industry will be able to fully embrace the new technologies. To address the areal measurement requirements for surface structuring, NPL has developed a new traceable measuring instrument with a working range of 8 mm x 8 mm x 0.1 mm and corresponding measurement uncertainties of 50 nm x 50 nm x 5 nm at a confidence level of 95%. The instrument is stylus based but with a novel, low force probe, capable of collecting data at high speed. NPL has also developed transfer artefacts that can be calibrated using the new traceable instrument and subsequently used to calibrate commercial stylus and optical instruments.

Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: Engineering Measurements
Engineering Measurements > Dimensional
Last Modified: 02 Feb 2018 13:15
URI: http://eprintspublications.npl.co.uk/id/eprint/4436

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