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Characteristics of focussed ion beam nanoscale Josephson devices.

Hao, L; Cox, D C; Gallop, J C (2009) Characteristics of focussed ion beam nanoscale Josephson devices. Supercond. Sci. Technol., 22 (6). 064011

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Abstract

The requirements of quantum metrology and nanoscience are driving the need for single particle detection capability across a wide variety of physics, including quantum information processes (QIP), single photon detection, nanoelectromechanical systems (NEMS), nanomagnetism and spintronics. Nanoscale superconducting quantum interference devices (NanoSQUIDs) represent a new manifestation of an old but exciting superconducting technology which addresses some of these requirements. In this paper we describe a straightforward approach to fabricating Nb microbridge weak-links using combined optical lithography and focused ion beam (FIB) which may be used in nanoscale SQUIDs. The devices show non-hysteretic current voltage characteristics and demonstrate very low noise, even at operating temperatures above 4.2K. To improve our understanding of the superconducting properties of the Josephson micro/nanobridge junctions which have proved very successful in realising low noise nanoSQUIDs we have carried out a combination of investigations including cryogenic resistance versus temperature (R(T)) and current voltage characteristic (IVC) measurements, atomic force microscope (AFM) scans, controlled Gallium (Ga) ion milling and implantation and ion beam track modelling of these Josephson devices and Nb thin films.

Item Type: Article
Keywords: FIB, Nanobridge, AFM, NanoSQUIDs
Subjects: Quantum Phenomena
Quantum Phenomena > Nanophysics
Last Modified: 02 Feb 2018 13:15
URI: http://eprintspublications.npl.co.uk/id/eprint/4382

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