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Quantitative AES IX and quantitative XPS II: Auger and X-ray photoelectron intensities from elemental spectra in digital databases reanalysed with a REELS database.

Seah, M P; Gilmore, I S; Spencer, S J (2001) Quantitative AES IX and quantitative XPS II: Auger and X-ray photoelectron intensities from elemental spectra in digital databases reanalysed with a REELS database. Surf. Interface Anal., 31. pp. 778-795.

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Abstract

No abstract available

Item Type: Article
Subjects: Nanoscience
Last Modified: 02 Feb 2018 13:17
URI: http://eprintspublications.npl.co.uk/id/eprint/4109

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