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Graphene: a review of the state of the art and future metrology applications

Hao, L; Gallop, J C; Cox, D; Janssen, T J B M (2007) Graphene: a review of the state of the art and future metrology applications. NPL Report. TQE 1

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Abstract

Metrology has a long history, over the past fifty years at least, of providing the first application of new science. The unexpected discovery of the existence of a true 2D isolated material, graphene, is a new and important material which was only discovered in 2004. Apart from fundamental physics interests it is becoming clear that it also has considerable metrological potential. This report includes a detailed literature search summarising the present state of the art of this new material, outlining prospects for longer term research work, ending with conclusions about future possible directions for NPL research. We also include suggestions for leading edge metrology (such as Quantum Hall Effect (QHE), SET, quantum resistor and capacitor, spintronics, quantum spin Hall effect), and the possibility of a number of enabling new sensor types in this area. A second component of this report describes our preliminary experimental work on preparation, identification, processing and characterisation of graphene samples, including AFM, SEM, confocal microscopy analysis, transport properties and optical response.

Item Type: Report/Guide (NPL Report)
NPL Report No.: TQE 1
Keywords: Nanoscience, Nano-dimensional, Quantum Phenomena, Nanophysics, Advanced Materials, Electrical Quantum Standard
Subjects: Nanoscience
Nanoscience > Nano-Materials
Last Modified: 02 Feb 2018 13:15
URI: http://eprintspublications.npl.co.uk/id/eprint/4091

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