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Application of a DFµA methodology to facilitate the assembly of a micro/nano measurement device.

Tietje,C*,, ; Leach, R K; Turitto, M*; Ronaldo, R*; Ratchev, S* (2009) Application of a DFµA methodology to facilitate the assembly of a micro/nano measurement device. IFIP International Federation for Information Processing, 260. pp. 5-12.

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Abstract

A lack of well defined Design for Microassembly (DFµA) methodologies to enable an increased transfer of prototypes from the research lab to production on industrial scale has been identified. Main benefit of such a methodology is the ad-aptation of the design by matching it with microassembly process characteristics. In addition there needs to be a push in metrology equipment to respond to the on-going trend of miniaturisation, enabling quality assurance for three dimensional products with nanometre features. The presented paper adresses these two gaps by utilising a novel DFµA methodology to enable a state-of-the-art CMM stylus as-sembly, which is characterised by extremely rigid and challenging requirements. The design of the parts to be assembled is shown. Furthermore the selection of the most suitable assembly equipment is supported. Finally the actual assembly sys-tem is described and illustrated as proof of validation.

Item Type: Article
Subjects: Nanoscience
Nanoscience > Nano-Dimensional
Last Modified: 02 Feb 2018 13:15
URI: http://eprintspublications.npl.co.uk/id/eprint/4076

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