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XPS: reference procedures for the accurate intensity calibration of electron spectrometers - results of a BCR intercomparison co-sponsored by the VAMAS SCA TWP.

Seah, M P (1993) XPS: reference procedures for the accurate intensity calibration of electron spectrometers - results of a BCR intercomparison co-sponsored by the VAMAS SCA TWP. Surf. Interface Anal., 20. pp. 243-266.

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Abstract

No abstract available

Item Type: Article
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Last Modified: 02 Feb 2018 13:19
URI: http://eprintspublications.npl.co.uk/id/eprint/4017

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