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Scattering in electron spectrometers, diagnosis and avoidance, I: concentric hemispherical analysers.

Seah, M P (1993) Scattering in electron spectrometers, diagnosis and avoidance, I: concentric hemispherical analysers. Surf. Interface Anal., 20. pp. 865-875.

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Abstract

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Item Type: Article
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Last Modified: 02 Feb 2018 13:19
URI: http://eprintspublications.npl.co.uk/id/eprint/4016

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