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XPS: energy calibration of electron spectrometers, 4 - an assessment of effects for different conditions and of the overall uncertainties.

Seah, M P; Gilmore, I S; Spencer, S J (1998) XPS: energy calibration of electron spectrometers, 4 - an assessment of effects for different conditions and of the overall uncertainties. Surf. Interface Anal., 26. pp. 617-641.

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Abstract

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Item Type: Article
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Last Modified: 02 Feb 2018 13:18
URI: http://eprintspublications.npl.co.uk/id/eprint/4012

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