< back to main site

Publications

Recent advances to establish XPS as an accurate metrology tool.

Seah, M P (2006) Recent advances to establish XPS as an accurate metrology tool. J. Surf. Anal., 13. pp. 136-141.

Full text not available from this repository.

Abstract

No abstract available

Item Type: Article
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Last Modified: 02 Feb 2018 13:16
URI: http://eprintspublications.npl.co.uk/id/eprint/4009

Actions (login required)

View Item View Item