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AES and XPS measurements: reducing the uncertainty and improving the accuracy.

Seah, M P (1993) AES and XPS measurements: reducing the uncertainty and improving the accuracy. Appl. Surf. Sci., 70-71. pp. 1-8.

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Abstract

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Item Type: Article
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Last Modified: 02 Feb 2018 13:19
URI: http://eprintspublications.npl.co.uk/id/eprint/3998

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