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'In situ' preparation and characterisation (AES, XPS) of thin thermal oxide films as material standards for an AES data bank.

Lorang, G*; Langeron, J P*; Seah, M P (1996) 'In situ' preparation and characterisation (AES, XPS) of thin thermal oxide films as material standards for an AES data bank. In: ECASIA 95, European Conference on Applications of Surface and Interface Analysis, 1996.

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Abstract

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Last Modified: 02 Feb 2018 13:19
URI: http://eprintspublications.npl.co.uk/id/eprint/3995

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