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Detecting and addressing the surface following errors in the calibration of step heights by atomic force microscopy.

Haycocks, J; Jackson, K (2007) Detecting and addressing the surface following errors in the calibration of step heights by atomic force microscopy. Meas. Sci. Technol., 18 (2). pp. 469-475.

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Abstract

No abstract available

Item Type: Article
Keywords: traceable calibration
Subjects: Nanoscience
Nanoscience > Nano-Dimensional
Last Modified: 02 Feb 2018 13:15
URI: http://eprintspublications.npl.co.uk/id/eprint/3893

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