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Measurement of sputtering yields and damage in C60 SIMS depth profiling of model organic materials.

Shard, A G; Brewer, P J; Green, F M; Gilmore, I S (2007) Measurement of sputtering yields and damage in C60 SIMS depth profiling of model organic materials. Surf. Interface Anal., 39. pp. 294-298.

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Abstract

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Item Type: Article
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Last Modified: 02 Feb 2018 13:15
URI: http://eprintspublications.npl.co.uk/id/eprint/3855

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