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Nanoscale measurement - important questions at the bottom.

Sheridan, B; Cumpson, P J; Bailey, M (2007) Nanoscale measurement - important questions at the bottom. ISO Focus, 4 (4). pp. 43-45.

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Abstract

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Item Type: Article
Subjects: Nanoscience
Last Modified: 02 Feb 2018 13:15
URI: http://eprintspublications.npl.co.uk/id/eprint/3848

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