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Mass accuracy - TOF-SIMS.

Green, F M; Gilmore, I S; Seah, M P (2006) Mass accuracy - TOF-SIMS. Appl. Surf. Sci., 252 (19). pp. 6591-6593.

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Abstract

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Item Type: Article
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Last Modified: 02 Feb 2018 13:16
URI: http://eprintspublications.npl.co.uk/id/eprint/3595

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